REFINED BOUNDS ON SIGNATURE ANALYSIS ALIASING FOR RANDOM TESTING

N. Saxena, P. Franco, E. McCluskey
{"title":"REFINED BOUNDS ON SIGNATURE ANALYSIS ALIASING FOR RANDOM TESTING","authors":"N. Saxena, P. Franco, E. McCluskey","doi":"10.1109/TEST.1991.519747","DOIUrl":null,"url":null,"abstract":"in previous work a simple bound, ~+2 , on the aliasing probability in serial signature analysis for a random test pattern of length L was derived. This simple bound is sharpened here by almost a factor of two. For serial signature analysis, it is shown that the I+& 1 aliasing probability is bounded above by - = L (E L small for large L) for test lengths L less than the period, Lc, of the signature polynomial. The simple bounds derived are compared with exact as well as experimentally measured aliasing probability values. It is conjectured that L-l is the best monotonic bound on the aliasing probability for serial signature analysis.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"40 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519747","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

in previous work a simple bound, ~+2 , on the aliasing probability in serial signature analysis for a random test pattern of length L was derived. This simple bound is sharpened here by almost a factor of two. For serial signature analysis, it is shown that the I+& 1 aliasing probability is bounded above by - = L (E L small for large L) for test lengths L less than the period, Lc, of the signature polynomial. The simple bounds derived are compared with exact as well as experimentally measured aliasing probability values. It is conjectured that L-l is the best monotonic bound on the aliasing probability for serial signature analysis.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
改进了随机测试中特征分析混叠的边界
在以前的工作中,我们推导了长度为L的随机测试模式在序列签名分析中混叠概率的一个简单界~+2。这个简单的边界在这里几乎是原来的2倍。对于串行签名分析,表明当测试长度L小于签名多项式的周期Lc时,I+& 1混叠概率的上界为- = L (E L小,L大)。推导出的简单边界与精确的混叠概率值以及实验测量的混叠概率值进行了比较。推测L-l是序列签名混叠概率的最佳单调界。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
REAL-TIME DATA COMPARISON FOR GIGAHERTZ DIGITAL TEST REFINED BOUNDS ON SIGNATURE ANALYSIS ALIASING FOR RANDOM TESTING IMPLEMENTING BOUNDARY-SCAN AND PSEUDO-RANDOM BIST IN AN ASYNCHRONOUS TRANSFER MODE SWITCH ADVANCED MIXED SIGNAL TESTING BY DSP LOCALIZED TESTER AN IEEE 1149.1 BASED LOGIC/SIGNATURE ANALYZER IN A CHIP
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1