{"title":"ADVANCED MIXED SIGNAL TESTING BY DSP LOCALIZED TESTER","authors":"K. Karube, Y. Bessho, T. Takakura, K. Gunji","doi":"10.1109/TEST.1991.519774","DOIUrl":null,"url":null,"abstract":"Koji Karube, Yoshiyuki Bessho, Tokuo Takakura, and Keita Gunji Yokogawa Hewlett-Packard 9-1, Takakura-cho, Hachioji, Tokyo JAPAN 192 W? developed a new arclzitechire tester iit which each resource has a local real-time digital signal processor (DSP) that enables the tester to peifonn wious applications. Previous&, this was difficult to do becaiue it required a yea t deal of nienioiy. Die tester calif also p e ~ o n i z real-tiine data processiiig, tlziis eliiiiiiiatiig the specialized hardware that is required for complicated nttixed-sigrzal device tests. Dzis paper not on@ show tlze liijuitatioizs related to previous arclzitectures, but also shows how ta use the tester to yerfoini ISDN tests mid the izewly developed ADC test.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519774","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Koji Karube, Yoshiyuki Bessho, Tokuo Takakura, and Keita Gunji Yokogawa Hewlett-Packard 9-1, Takakura-cho, Hachioji, Tokyo JAPAN 192 W? developed a new arclzitechire tester iit which each resource has a local real-time digital signal processor (DSP) that enables the tester to peifonn wious applications. Previous&, this was difficult to do becaiue it required a yea t deal of nienioiy. Die tester calif also p e ~ o n i z real-tiine data processiiig, tlziis eliiiiiiiatiig the specialized hardware that is required for complicated nttixed-sigrzal device tests. Dzis paper not on@ show tlze liijuitatioizs related to previous arclzitectures, but also shows how ta use the tester to yerfoini ISDN tests mid the izewly developed ADC test.
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