{"title":"Current-mode techniques for analog VLSI: technology and defect tolerance issues","authors":"A. Andreou","doi":"10.1109/DFTVS.1991.199942","DOIUrl":null,"url":null,"abstract":"Future large scale analog computational systems will have to cope with manufacturing defects and mismatch in individual components. The author argues that current-mode design techniques, and in particular minimal designs at the transistor level are consistent with future manufacturing requirements for wafer scale analog systems.<<ETX>>","PeriodicalId":440536,"journal":{"name":"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1991.199942","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Future large scale analog computational systems will have to cope with manufacturing defects and mismatch in individual components. The author argues that current-mode design techniques, and in particular minimal designs at the transistor level are consistent with future manufacturing requirements for wafer scale analog systems.<>
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