14.8 A 0.009mm2 2.06mW 32-to-2000MHz 2nd-order ΔΣ analogous bang-bang digital PLL with feed-forward delay-locked and phase-locked operations in 14nm FinFET technology

Minyoung Song, Taeik Kim, Jihyun F. Kim, Wooseok Kim, Sung-Jin Kim, Hojin Park
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引用次数: 7

Abstract

The race to deep sub-micron CMOS technology has resulted in a change in device architectures, from a planar structure to a FinFET to achieve decreased leakage, further downscaling, and better sub-threshold slope, even under a lower power supply. Downscaling trends have forced the analog semiconductor industry to move to the digital domain to maintain functionality in light of increasing short-channel effects and device mismatch. Furthermore, the main goal of the new technology is to achieve faster speed and lower cost. In leading-edge processes and design environments, conventional analog PLLs in systems-on-chip (SoCs) are being replaced by digitally operated PLLs to meet clock requirements for optimal overall system performance. While a widely used time-to-digital converter (TDC)-based digital PLL (TDC-DPLL) has a linear loop characteristic, which is simple and analogous to well-known analog PLLs, it has to overcome noise issues from TDC quantization error and phase noise from the digitally-controlled oscillator (DCO). The in-band noise floor of a TDC-DPLL is determined by the TDC resolution. Thanks to noise shaping techniques with oversampling and a pipelined architecture, noise performance can be improved. However, significant area and power must be spent to meet noise requirements. A bang-bang-based digital PLL (BB-DPLL), as the alternative type of DPLL has advantages in terms of area and power over a TDC-DPLL. However, its non-linear operation implies a longer lock time, limit-cycle noise, and high sensitivity to DCO noise. In addition, the in-band noise floor of a BB-DPLL is dominated by the input-tracking jitter, which mainly arises from the DCO noise. This paper presents a BB-DPLL in 14nm FinFET technology, combining a feed-forward delay-locked part (FFDLP) and phase-locked part (PLP) to mitigate aforementioned weaknesses.
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14.8 A 0.009mm2 2.06mW 32至2000mhz二阶ΔΣ模拟bang-bang数字锁相环,采用14nm FinFET技术,具有前馈锁相和锁相操作
对深亚微米CMOS技术的竞争导致了器件架构的变化,从平面结构到FinFET,即使在较低的电源下也能实现更少的泄漏,进一步缩小尺寸和更好的亚阈值斜率。缩小尺寸的趋势迫使模拟半导体行业转移到数字领域,以维持短通道效应和器件不匹配增加的功能。此外,新技术的主要目标是实现更快的速度和更低的成本。在先进的工艺和设计环境中,片上系统(soc)中的传统模拟锁相环正在被数字操作的锁相环所取代,以满足最佳整体系统性能的时钟要求。虽然广泛使用的基于时间-数字转换器(TDC)的数字锁相环(TDC- dpll)具有线性环路特性,该特性简单且类似于已知的模拟锁相环,但它必须克服由TDC量化误差和数字控制振荡器(DCO)产生的相位噪声问题。TDC- dpll的带内底噪声由TDC分辨率决定。由于采用过采样和流水线结构的噪声整形技术,噪声性能可以得到改善。然而,必须花费大量的面积和功率来满足噪声要求。基于砰砰声的数字PLL (BB-DPLL)作为DPLL的替代类型,在面积和功率方面优于TDC-DPLL。然而,它的非线性工作意味着较长的锁定时间、限环噪声和对DCO噪声的高灵敏度。此外,BB-DPLL的带内底噪声主要由输入跟踪抖动控制,而输入跟踪抖动主要来源于DCO噪声。本文提出了一种采用14nm FinFET技术的BB-DPLL,结合前馈锁相部分(FFDLP)和锁相部分(PLP)来减轻上述缺点。
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