{"title":"A software system architecture for testing multiple part number wafers","authors":"R. M. Smyczynski, K. Brennan","doi":"10.1109/VTEST.1991.208147","DOIUrl":null,"url":null,"abstract":"Testing single part number wafers is the normal mode of testing semiconductor devices in the industry today. However, as wafers get larger it may become more economical to put different devices on the same wafer resulting in multiple part number wafers. The authors describe a system architecture that allows for the testing of such wafers.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1991.208147","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Testing single part number wafers is the normal mode of testing semiconductor devices in the industry today. However, as wafers get larger it may become more economical to put different devices on the same wafer resulting in multiple part number wafers. The authors describe a system architecture that allows for the testing of such wafers.<>
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