Electrical/thermal co-design and co-simulation, from chip, package, board to system

C. Kao, A. Kuo, Yun Dai
{"title":"Electrical/thermal co-design and co-simulation, from chip, package, board to system","authors":"C. Kao, A. Kuo, Yun Dai","doi":"10.1109/VLSI-DAT.2016.7482540","DOIUrl":null,"url":null,"abstract":"It has been well known for years that as the critical feature size within a chip keeps shrinking, design and optimization among power, heat and performance would become even challenging. On one hand, the electrical functionalities of the devices are closely coupled with temperature and power distributions. On the other hand, the devices within the chip are not totally isolated and confined - the connection and interaction with the environments such as the package, board, and enclosure cannot be ignored especially from the heat transport perspective. Simulation tools in electronic design automation have to satisfy the requirement of electrical/thermal co-simulation for advanced electronic systems having a wide range of critical sizes, and provide efficient approaches with accurate data for design optimization. This is the main purpose of this paper, and we introduce a portfolio of tools to facilitate electrical/thermal co-simulation from chip, package, board to system.","PeriodicalId":380961,"journal":{"name":"2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-DAT.2016.7482540","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

Abstract

It has been well known for years that as the critical feature size within a chip keeps shrinking, design and optimization among power, heat and performance would become even challenging. On one hand, the electrical functionalities of the devices are closely coupled with temperature and power distributions. On the other hand, the devices within the chip are not totally isolated and confined - the connection and interaction with the environments such as the package, board, and enclosure cannot be ignored especially from the heat transport perspective. Simulation tools in electronic design automation have to satisfy the requirement of electrical/thermal co-simulation for advanced electronic systems having a wide range of critical sizes, and provide efficient approaches with accurate data for design optimization. This is the main purpose of this paper, and we introduce a portfolio of tools to facilitate electrical/thermal co-simulation from chip, package, board to system.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
从芯片、封装、电路板到系统的电气/热协同设计和协同仿真
众所周知,随着芯片内关键特征尺寸的不断缩小,在功耗、热量和性能方面的设计和优化将变得更加具有挑战性。一方面,器件的电气功能与温度和功率分布密切相关。另一方面,芯片内的器件并不是完全隔离和受限的,特别是从热传输的角度来看,与封装、电路板和外壳等环境的连接和相互作用不容忽视。电子设计自动化中的仿真工具必须满足具有广泛临界尺寸的先进电子系统的电/热联合仿真要求,并为设计优化提供有效的方法和准确的数据。这是本文的主要目的,我们介绍了一套工具来促进从芯片,封装,板到系统的电/热联合仿真。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A 2×25Gb/s 20mW serializing transmitter with 2.5:1 multiplexers in 40nm technology A Test-per-cycle BIST architecture with low area overhead and no storage requirement Electrical/thermal co-design and co-simulation, from chip, package, board to system DAC linearity improvement algorithm with unit cell sorting based on magic square A multi-axis readout circuit using in female ovulation monitoring platform
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1