Logo Classification and Data Augmentation Techniques for PCB Assurance and Counterfeit Detection

Mukhil Azhagan Mallaiyan Sathiaseelan, Olivia P. Paradis, Rajat Rai, Suryaprakash Vasudev Pandurangi, Manoj Yasaswi Vutukuru, S. Taheri, N. Asadizanjani
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引用次数: 4

Abstract

In this manuscript, we present our work on Logo classification in PCBs for Hardware assurance purposes. Identifying and classifying logos have important uses for text detection, component authentication and counterfeit detection. Since PCB assurance faces the lack of a representative dataset for classification and detection tasks, we collect different variants of logos from PCBs and present data augmentation techniques to create the necessary data to perform machine learning. In addition to exploring the challenges for image classification tasks in PCBs, we present experiments using Random Forest classifiers, Bag of Visual Words (BoVW) using SIFT and ORB Fully Connected Neural Networks (FCN) and Convolutional Neural Network (CNN) architectures. We present results and also a discussion on the edge cases where our algorithms fail including the potential for future work in PCB logo detection. The code for the algorithms along with the dataset that includes 18 classes of logos with 14000+ images is provided at this link: https://www.trusthub.org/#/data Index Terms—AutoBoM, Logo classification, Data augmentation, Bill of materials, PCB Assurance, Hardware Assurance, Counterfeit avoidance
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用于PCB保证和假冒检测的标识分类和数据增强技术
在这份手稿中,我们介绍了我们在pcb中用于硬件保证目的的徽标分类方面的工作。标识的识别与分类在文本检测、成分认证和假冒检测等方面有着重要的应用。由于PCB保证面临缺乏用于分类和检测任务的代表性数据集,我们从PCB中收集不同的徽标变体,并提出数据增强技术,以创建执行机器学习所需的数据。除了探索pcb中图像分类任务的挑战之外,我们还介绍了使用随机森林分类器的实验,使用SIFT和ORB全连接神经网络(FCN)和卷积神经网络(CNN)架构的视觉词袋(BoVW)。我们提出了结果,并讨论了我们的算法失败的边缘情况,包括PCB标识检测中未来工作的潜力。算法代码以及包含18类带有14000多个图像的徽标的数据集在此链接中提供:https://www.trusthub.org/#/data索引术语-自动bom,徽标分类,数据增强,物料清单,PCB保证,硬件保证,防伪
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SCM Application and Failure Analysis Procedure for Ion-Implantation Issues in Power Devices Low Angle Annular Dark Field Scanning Transmission Electron Microscopy Analysis of Phase Change Material Report Classification for Semiconductor Failure Analysis Application and Optimization of Automated ECCI Mapping to the Analysis of Lowly Defective Epitaxial Films on Blanket or Patterned Wafers Logo Classification and Data Augmentation Techniques for PCB Assurance and Counterfeit Detection
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