SOI CMOS front-end technology: options and tradeoffs

D. Antoniadis
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引用次数: 6

Abstract

There is general agreement that SOI CMOS has the potential of becoming a mainstream technology for future high performance and low-power logic applications. For this to be fulfilled, SOI CMOS technology should be able to support the design and manufacturing of complex future microprocessors. Then, from the design standpoint, SOI CMOS should be nearly identical to bulk CMOS, so that design tools, methodologies, and functional blocks can all be transferred with minimal perturbation. From the manufacturing standpoint, SOI CMOS should produce acceptable yields in circuits with 10 to 100 M transistors which will require process robustness latitude, scalability, and cost equivalent to or better than bulk. From the circuit design standpoint it is generally acknowledged that fully-depleted (FD) MOSFET's will provide the easier transfer path, because of their lack of significant floating-body (FB) effects under normal operation. However, scaled FD-MOSFET's require very thin SOI films which pose several technological challenges. On the other hand, partially-depleted (PD) MOSFET's are easier to make; indeed, their front-end technology can be imported from bulk with minimal perturbation. However, they display prominent FB effects which can pose problems in circuit design. The choice between the FD versus PD option is then recognized as the main SOI front-end technology tradeoff.
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SOI CMOS前端技术:选择和权衡
人们普遍认为,SOI CMOS有潜力成为未来高性能和低功耗逻辑应用的主流技术。为了实现这一点,SOI CMOS技术应该能够支持复杂的未来微处理器的设计和制造。然后,从设计的角度来看,SOI CMOS应该与批量CMOS几乎相同,这样设计工具、方法和功能块都可以在最小的干扰下转移。从制造的角度来看,SOI CMOS应该在10到100 M晶体管的电路中产生可接受的产量,这将需要工艺稳健性、可扩展性和相当于或优于批量的成本。从电路设计的角度来看,人们普遍认为完全耗尽(FD) MOSFET将提供更容易的转移路径,因为它们在正常工作下缺乏显着的浮体(FB)效应。然而,缩放FD-MOSFET需要非常薄的SOI薄膜,这带来了几个技术挑战。另一方面,部分耗尽(PD) MOSFET更容易制造;事实上,他们的前端技术可以以最小的扰动从散装进口。然而,它们显示出突出的FB效应,这可能给电路设计带来问题。FD与PD之间的选择被认为是主要的SOI前端技术权衡。
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Analytical threshold voltage model for short channel n/sup +/-p/sup +/ double-gate SOI MOSFETs Front and back gate interface-trap generation due to hot carrier stress in fully depleted SOI/MOSFETs SOI material characterization using optical second harmonic generation Minimum parasitic resistance for ultra-thin SOI MOSFET with high-permittivity gate insulator performed by lateral contact structure Transient effects in floating body SOI NMOSFETs
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