Novel I/O-bump design and optimization for chip-package codesign

R. Lee, Hung-Ming Chen
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Abstract

While the advanced very large scale integration (VLSI) circuit is scaling to deep-submicrometer (DSM) technology, the I/O placement plays a key role in affecting the die size and interconnect. The flip-chip area-array ICs meet the requirements of higher I/O density and lower parasitic effects, but essentially need the optimized I/O and bump placement. In this paper we skip the redistribution layer (RDL) routing and design the specific I/O-bump tiles based on an innovative I/O-row scheme. By considering the package ball location, our proposed I/O-bump planning methodologies produce a package-aware I/O-bump location for chip-level core cell placement and package-level routing task. Thus, our algorithms provide the concurrent chip-package coplanning/codesign flow and dramatically speed up the design process. The experimental results show that our methods optimize the performance metrics in designing the interface between chip and package, such as the net crossing, total wirelength and length deviation.
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新颖的I/ o碰撞设计与芯片封装协同设计优化
在先进的超大规模集成电路(VLSI)向深亚微米(DSM)技术发展的过程中,I/O的放置是影响芯片尺寸和互连的关键因素。倒装片面积阵列集成电路满足更高I/O密度和更低寄生效应的要求,但本质上需要优化I/O和凸点放置。在本文中,我们跳过了重新分配层(RDL)路由,并基于一种创新的I/ o行方案设计了特定的I/ o碰撞块。通过考虑封装球位置,我们提出的I/ o碰撞规划方法为芯片级核心单元放置和封装级路由任务产生封装感知的I/ o碰撞位置。因此,我们的算法提供了并发的芯片封装协同规划/协同设计流程,并大大加快了设计过程。实验结果表明,我们的方法优化了芯片与封装之间的接口设计的性能指标,如网络交叉、总长度和长度偏差。
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