{"title":"I-V curves for cylinders embedded in P3HT","authors":"C. Huang, M. Stroscio","doi":"10.1109/IWCE.2015.7301964","DOIUrl":null,"url":null,"abstract":"Comparison between simulation and measurement of Current-Voltage curves for CdS cylinders embedded in P3HT. Using interface recombination makes the curve of simulation to match the curve of measurement.","PeriodicalId":165023,"journal":{"name":"2015 International Workshop on Computational Electronics (IWCE)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 International Workshop on Computational Electronics (IWCE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWCE.2015.7301964","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Comparison between simulation and measurement of Current-Voltage curves for CdS cylinders embedded in P3HT. Using interface recombination makes the curve of simulation to match the curve of measurement.
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