Designing a memory module tester

D.P. van der Velde, A.J. v.d. Goor
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引用次数: 3

Abstract

In the manufacturing process of memory modules (such as SIMMs and DIMMs), first memories are tested at the die level, then at the chip level, and finally at the module level. For the latter special module testers are available. This paper gives an analysis of commercially available module testers and shows their restrictions. Then it lists the requirements for a more advanced module tester, after which a complete functional design is given. The result is a very flexible tester capable of testing FPM/EDO and SDRAM memories, programmable using Texas Instruments TMS320C6201 DSPs and Vantis CPLDs, with an expected end-user price of less than US$ 20,000.
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设计一个内存模块测试器
在内存模块(如simm和dimm)的制造过程中,首先在芯片级测试内存,然后在芯片级测试内存,最后在模块级测试内存。对于后者,可以使用专用模块测试仪。本文对市面上现有的模块测试仪进行了分析,并指出了它们的局限性。然后列出了一个更高级的模块测试仪的需求,然后给出了完整的功能设计。结果是一个非常灵活的测试仪,能够测试FPM/EDO和SDRAM存储器,使用德州仪器TMS320C6201 dsp和Vantis cpld进行编程,预计最终用户价格低于20,000美元。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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