H. Reisinger, Tibor Grasser, K. Hofmann, W. Gustin, C. Schlunder
{"title":"The impact of recovery on BTI reliability assessments","authors":"H. Reisinger, Tibor Grasser, K. Hofmann, W. Gustin, C. Schlunder","doi":"10.1109/IIRW.2010.5706474","DOIUrl":null,"url":null,"abstract":"BTI is shown to be the most important device degradation mechanism for combinational logic. Significant benefits regarding lifetime predictions and the total effort in measurement time can be expected from measurements minimizing recovery by a short measuring delay or/and assessments being done with AC stress for applications ensuring AC operation only.","PeriodicalId":332664,"journal":{"name":"2010 IEEE International Integrated Reliability Workshop Final Report","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Integrated Reliability Workshop Final Report","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IIRW.2010.5706474","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14
Abstract
BTI is shown to be the most important device degradation mechanism for combinational logic. Significant benefits regarding lifetime predictions and the total effort in measurement time can be expected from measurements minimizing recovery by a short measuring delay or/and assessments being done with AC stress for applications ensuring AC operation only.
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