{"title":"Design for testability for mixed analog/digital ASICs","authors":"P. Fasang, D. Mullins, T. Wong","doi":"10.1109/CICC.1988.20881","DOIUrl":null,"url":null,"abstract":"A description is given of the concept and issues of design for testability for mixed analog-digital circuits, an architecture for testable circuits of this type, general testing procedure, and the concept of analog test tables. The analog test tables contain information such as what parameters are selected for testing, what nodes need to be accessible, and testing conditions.<<ETX>>","PeriodicalId":313270,"journal":{"name":"Proceedings of the IEEE 1988 Custom Integrated Circuits Conference","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"62","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 1988 Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.1988.20881","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 62
Abstract
A description is given of the concept and issues of design for testability for mixed analog-digital circuits, an architecture for testable circuits of this type, general testing procedure, and the concept of analog test tables. The analog test tables contain information such as what parameters are selected for testing, what nodes need to be accessible, and testing conditions.<>
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