{"title":"Application of Step Stress to Time Dependent Breakdown","authors":"E. S. Anolick, Li-Yu Chen","doi":"10.1109/IRPS.1981.362967","DOIUrl":null,"url":null,"abstract":"A method of speeding up testing by step stressing is described. The mathematic models utilized, the theoretical and experimental results, and application to final failure rate estimates are shown.","PeriodicalId":376954,"journal":{"name":"19th International Reliability Physics Symposium","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1981.362967","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
A method of speeding up testing by step stressing is described. The mathematic models utilized, the theoretical and experimental results, and application to final failure rate estimates are shown.