{"title":"Guardbanding VLSI EEPROM test programs","authors":"D. Sweetman","doi":"10.1109/VTEST.1991.208151","DOIUrl":null,"url":null,"abstract":"The test and guardband philosophy is essential in the manufacturing of integrated circuits. The philosophy integrates the general rules for test sequences, hardware, and software. The data sheet and philosophy determine the values and methodology for parameter and functional tests. Guardbanding is the off-setting of a test parameter, condition, or attribute acceptance level from the specified value. Variability in equipment and device performance necessitate machine guardbands. Device and test program guardbands improve test productivity. Changing the applied, measured, or external conditions from those specified implements the guardbands for attribute testing. The author addresses the use of guardbands for an MOS VLSI EEPROM, i.e. a nonvolatile reprogrammable memory.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1991.208151","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The test and guardband philosophy is essential in the manufacturing of integrated circuits. The philosophy integrates the general rules for test sequences, hardware, and software. The data sheet and philosophy determine the values and methodology for parameter and functional tests. Guardbanding is the off-setting of a test parameter, condition, or attribute acceptance level from the specified value. Variability in equipment and device performance necessitate machine guardbands. Device and test program guardbands improve test productivity. Changing the applied, measured, or external conditions from those specified implements the guardbands for attribute testing. The author addresses the use of guardbands for an MOS VLSI EEPROM, i.e. a nonvolatile reprogrammable memory.<>
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