C. Shen, L. T. Yang, E. Toh, C. Heng, G. Samudra, Y. Yeo
{"title":"A new robust non-local algorithm for band-to-band tunneling simulation and its application to Tunnel-FET","authors":"C. Shen, L. T. Yang, E. Toh, C. Heng, G. Samudra, Y. Yeo","doi":"10.1109/VTSA.2009.5159316","DOIUrl":null,"url":null,"abstract":"A new non-local algorithm for accurately calculating the band-to-band tunneling current suitable for TCAD semiconductor simulators is proposed in this abstract. The proposed algorithm captures the essential physics of multi-dimensional tunneling in a 2D structure, and is designed to be robust and to achieve independence on the mesh grid. The new algorithm enables accurate modeling of T-FET and investigation of its device physics. Application on T-FET is demonstrated. The physical origin of the saturation of Id-Vd curve of T-FET is analyzed and clarified for the first time.","PeriodicalId":309622,"journal":{"name":"2009 International Symposium on VLSI Technology, Systems, and Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"49","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Symposium on VLSI Technology, Systems, and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTSA.2009.5159316","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 49
Abstract
A new non-local algorithm for accurately calculating the band-to-band tunneling current suitable for TCAD semiconductor simulators is proposed in this abstract. The proposed algorithm captures the essential physics of multi-dimensional tunneling in a 2D structure, and is designed to be robust and to achieve independence on the mesh grid. The new algorithm enables accurate modeling of T-FET and investigation of its device physics. Application on T-FET is demonstrated. The physical origin of the saturation of Id-Vd curve of T-FET is analyzed and clarified for the first time.