14.9 Sub-sampling all-digital fractional-N frequency synthesizer with −111dBc/Hz in-band phase noise and an FOM of −242dB

Zuow-Zun Chen, Yen-Hsiang Wang, Jaewook Shin, Yan Zhao, S. A. Mirhaj, Yen-Cheng Kuan, H. Chen, C. Jou, M. Tsai, F. Hsueh, Mau-Chung Frank Chang
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引用次数: 42

Abstract

The noise performance of an all-digital phase-locked loop (ADPLL) is limited by the resolution of the time-to-digital converter (TDC). Most TDC research in the past focused on the arrival time difference between the edges of the divider feedback and the reference signal [1-2]. This results in coarser TDC resolution and worse ADPLL noise performance. This paper presents a fractional-/VADPLL that employs a new time-to-digital conversion technique based on sub-sampling phase detection. It is accomplished by directly sampling the analog voltage signal at the PLL's high frequency node and converting it into a digital code. This achieves a higher time resolution with less power.
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14.9次采样全数字分数n频率合成器,带内相位噪声为−111dBc/Hz, FOM为−242dB
全数字锁相环(ADPLL)的噪声性能受到时间-数字转换器(TDC)分辨率的限制。过去的TDC研究大多集中在分压器反馈边缘与参考信号的到达时间差上[1-2]。这将导致较粗的上止点分辨率和较差的ADPLL噪声性能。本文提出了一种分数阶/VADPLL,它采用了一种新的基于次采样相位检测的时间-数字转换技术。它通过在锁相环的高频节点直接采样模拟电压信号并将其转换为数字代码来完成。这样可以用更少的功率实现更高的时间分辨率。
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