High Voltage MOS Transistor with a Folded n- Region for Flash Technology

F. Hofmann, W. Rosner, E. Landgraf
{"title":"High Voltage MOS Transistor with a Folded n- Region for Flash Technology","authors":"F. Hofmann, W. Rosner, E. Landgraf","doi":"10.1109/ESSDERC.2000.194757","DOIUrl":null,"url":null,"abstract":"Floating gate devices like EEPROM and Flash memory require high voltages up to 20 V for programming and erase operations. This high voltage can only be handled with large MOS transistors. A common approach is to form a drift region which increases the on-resistance of the transistor. Here an extra voltage drop between the contact and the transistor channel is gernerated. In order to save chip area, a transistor is presented with the high resistive drift regions folded into the trenches on both sides of the gate.","PeriodicalId":354721,"journal":{"name":"30th European Solid-State Device Research Conference","volume":"162 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"30th European Solid-State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2000.194757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Floating gate devices like EEPROM and Flash memory require high voltages up to 20 V for programming and erase operations. This high voltage can only be handled with large MOS transistors. A common approach is to form a drift region which increases the on-resistance of the transistor. Here an extra voltage drop between the contact and the transistor channel is gernerated. In order to save chip area, a transistor is presented with the high resistive drift regions folded into the trenches on both sides of the gate.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
用于闪存技术的n区折叠高压MOS晶体管
像EEPROM和闪存这样的浮门器件需要高达20 V的高电压来进行编程和擦除操作。这种高电压只能用大型MOS晶体管来处理。一种常见的方法是形成一个增加晶体管导通电阻的漂移区。在触点和晶体管通道之间产生额外的电压降。为了节省芯片面积,晶体管的高阻漂移区被折叠到栅极两侧的沟槽中。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
The influence of silicon interstitial clusters on the Reverse Short Channel Effect 3D self-assembling and actuation of electrostatic micro-mirrors A Comparative Study of Surface and Buried P-Channel 0.10um MOSFETs Numerical Simulation and Comparison of Vertical and Lateral SiGe HBT's for RF/Microwave Applications Electron injection in MOSFETs with a self-consistent Si and SiO2 BTE solution based on spherical-harmonics expansion
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1