{"title":"High Voltage MOS Transistor with a Folded n- Region for Flash Technology","authors":"F. Hofmann, W. Rosner, E. Landgraf","doi":"10.1109/ESSDERC.2000.194757","DOIUrl":null,"url":null,"abstract":"Floating gate devices like EEPROM and Flash memory require high voltages up to 20 V for programming and erase operations. This high voltage can only be handled with large MOS transistors. A common approach is to form a drift region which increases the on-resistance of the transistor. Here an extra voltage drop between the contact and the transistor channel is gernerated. In order to save chip area, a transistor is presented with the high resistive drift regions folded into the trenches on both sides of the gate.","PeriodicalId":354721,"journal":{"name":"30th European Solid-State Device Research Conference","volume":"162 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"30th European Solid-State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2000.194757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Floating gate devices like EEPROM and Flash memory require high voltages up to 20 V for programming and erase operations. This high voltage can only be handled with large MOS transistors. A common approach is to form a drift region which increases the on-resistance of the transistor. Here an extra voltage drop between the contact and the transistor channel is gernerated. In order to save chip area, a transistor is presented with the high resistive drift regions folded into the trenches on both sides of the gate.