{"title":"A highly testable 1-out-of-3 CMOS checker","authors":"C. Metra, M. Favalli, P. Olivo, B. Riccò","doi":"10.1109/DFTVS.1993.595823","DOIUrl":null,"url":null,"abstract":"The problem of the design of a highly testable 1-out-of-3 CMOS checker has been considered. First some recently presented CMOS checkers have been analyzed, then a novel checker has been proposed to be certainly preferable from the self-testing capability and overall performance point of view.","PeriodicalId":213798,"journal":{"name":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1993.595823","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
The problem of the design of a highly testable 1-out-of-3 CMOS checker has been considered. First some recently presented CMOS checkers have been analyzed, then a novel checker has been proposed to be certainly preferable from the self-testing capability and overall performance point of view.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
