J. Marek, J. Kozarik, A. Chvála, M. Minárik, L. Stuchlíková
{"title":"Degradation of Power SiC MOSFET under Repetitive UIS and Short Circuit Stress","authors":"J. Marek, J. Kozarik, A. Chvála, M. Minárik, L. Stuchlíková","doi":"10.14311/isps.2021.010","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":125960,"journal":{"name":"ISPS'21 Proceedings","volume":"7 33","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISPS'21 Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.14311/isps.2021.010","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}