Jeong-Uk Han, Yong Kyu Lee, Changmin Jeon, Jido Ryu, Eunmi Hong, Seungjin Yang, Youngho Kim, Hyucksoo Yang, Hyun-Khe Yoo, Jaemin Yu, Hoonjin Bang, Seung-Woon Lee, B. Lee, Daesop Lee, E. Jung, C. Chung
{"title":"Both NOR and NAND Embedded Hybrid Flash for S-SIM Application Using 90 nm Process Technology","authors":"Jeong-Uk Han, Yong Kyu Lee, Changmin Jeon, Jido Ryu, Eunmi Hong, Seungjin Yang, Youngho Kim, Hyucksoo Yang, Hyun-Khe Yoo, Jaemin Yu, Hoonjin Bang, Seung-Woon Lee, B. Lee, Daesop Lee, E. Jung, C. Chung","doi":"10.1109/IMW.2009.5090582","DOIUrl":null,"url":null,"abstract":"We have firstly demonstrated a hybrid flash including both NOR and NAND cell in a single chip using 90 nm logic technology for S-SIM (Super-Subscriber Identity Module) application. The memory sizes are 16 MB NAND and 768 kB NOR flash, respectively. The flash memory cells exhibited over 10 k-cycle endurance and 10-year retention for the successful smart card application.","PeriodicalId":113507,"journal":{"name":"2009 IEEE International Memory Workshop","volume":"63 11","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE International Memory Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2009.5090582","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We have firstly demonstrated a hybrid flash including both NOR and NAND cell in a single chip using 90 nm logic technology for S-SIM (Super-Subscriber Identity Module) application. The memory sizes are 16 MB NAND and 768 kB NOR flash, respectively. The flash memory cells exhibited over 10 k-cycle endurance and 10-year retention for the successful smart card application.
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