MAXIMIZING AND MAINTAINING AC TEST ACCURACY IN THE MANUFACTURING ENVIRONMENT

Abstract

The need for sub-nanosecond (ns) test accuracy is especially acute in array testing, where margins of only a few hundred picoseconds (ps) may exist. The challenge of maximizing tester accuracy is increased when the tester must perform in a manufacturing environment, where capacity is as important as accuracy. This, at least partially, explains why some form of autocalibration is standard on virtually all modcrn test equipment. In spite of autocalibration, achieving accurate AC test iesults ui a volume manufacturing environment remains an elusive goal.