Multi-level lateral phase change memory based on N-doped Sb70Te30 super-lattice like structure

H. Yang, L. P. Shi, H. K. Lee, R. Zhao, M.H. Li, J.M. Li, K. G. Lim, T. Chong
{"title":"Multi-level lateral phase change memory based on N-doped Sb70Te30 super-lattice like structure","authors":"H. Yang, L. P. Shi, H. K. Lee, R. Zhao, M.H. Li, J.M. Li, K. G. Lim, T. Chong","doi":"10.1109/IMW.2010.5488400","DOIUrl":null,"url":null,"abstract":"A multi-layer lateral PCM with N-doped Sb70Te30 was proposed and demonstrated. Both current sweep and pulse mode dynamic resistance test show that multi states exist in the device, which can be used for multi-level data storage. Simulation shows the working mechanism of multi-level and confirms the experiment results. More intermediate states can be realized by increasing the cycles of N-doped Sb70Te30 and ZnS-SiO2 deposited and by using different film thickness, which will be a promising solution to increase the data storage capacity for PCM largely.","PeriodicalId":149628,"journal":{"name":"2010 IEEE International Memory Workshop","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Memory Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2010.5488400","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

A multi-layer lateral PCM with N-doped Sb70Te30 was proposed and demonstrated. Both current sweep and pulse mode dynamic resistance test show that multi states exist in the device, which can be used for multi-level data storage. Simulation shows the working mechanism of multi-level and confirms the experiment results. More intermediate states can be realized by increasing the cycles of N-doped Sb70Te30 and ZnS-SiO2 deposited and by using different film thickness, which will be a promising solution to increase the data storage capacity for PCM largely.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于n掺杂Sb70Te30类超晶格结构的多层横向相变存储器
提出并演示了一种掺n的Sb70Te30多层横向PCM。电流扫描和脉冲模式动态电阻测试表明,该器件存在多态,可用于多级数据存储。仿真结果显示了多级的工作机理,验证了实验结果。通过增加n掺杂Sb70Te30和ZnS-SiO2的沉积周期以及使用不同的薄膜厚度,可以实现更多的中间态,这将是大幅度提高PCM数据存储容量的一个有希望的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Experimental characterization of SET seasoning on Phase Change Memory arrays Flexible and transparent ReRAM with GZO-memory-layer and GZO-electrodes on large PEN sheet NBTI stress relaxation design for scaling high-voltage transistors in NAND Flash memories Exploration of rare earth materials for future interpoly dielectric replacement in Flash memory devices Technology challenges for deep-nano semiconductor
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1