An Automated Framework for Variability Analysis using Simulated Annealing

Abstract

In the design process of integrated circuits, design and process variability plays an important role in the performance of the circuits. In this paper, an automated framework for Variability Analysis of CMOS circuits is proposed using simulated annealing algorithm. A practical study of variability analysis of phase noise in a 2.4 GHz CMOS oscillator is illustrated using this framework. The performance for the proposed framework for Variability Analysis application is validated by comparing it with the conventional Monte Carlo simulations. A significant gain in terms of computational time is reported.