Donna J. Cochran, Dakai Chen, T. Oldham, A. Sanders, Hak S. Kim, M. Campola, S. Buchner, K. Label, C. Marshall, J. Pellish, M. Carts, M. O’Bryan
{"title":"Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA","authors":"Donna J. Cochran, Dakai Chen, T. Oldham, A. Sanders, Hak S. Kim, M. Campola, S. Buchner, K. Label, C. Marshall, J. Pellish, M. Carts, M. O’Bryan","doi":"10.1109/redw.2010.5619507","DOIUrl":null,"url":null,"abstract":"Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.","PeriodicalId":278033,"journal":{"name":"2010 IEEE Radiation Effects Data Workshop","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Radiation Effects Data Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/redw.2010.5619507","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
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