{"title":"CIRCUIT PACK BIST FROM SYSTEM TO FACTORY - THE MCERT CHIP","authors":"Partha Raghavachari","doi":"10.1109/TEST.1991.519728","DOIUrl":null,"url":null,"abstract":"We describe a VLSI device used in AT&:T StarServerTM products that provid.ea hamdware EiIST at the circuit board level. It integrakes memory control, error regulation and test functions for memory arrays. Programmable memory test algorithms may be invoked by the system user. A factory interface to the BIST facility is provided through boundary scam.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519728","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
We describe a VLSI device used in AT&:T StarServerTM products that provid.ea hamdware EiIST at the circuit board level. It integrakes memory control, error regulation and test functions for memory arrays. Programmable memory test algorithms may be invoked by the system user. A factory interface to the BIST facility is provided through boundary scam.
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