Statistical design for variation tolerance: key to continued Moore's law

Abstract

Future high performance microprocessor design with technology scaling beyond 90nm will face a major challenge - parameter variations. Design practice will have to change from deterministic design to statistical design for variation tolerance. This paper discusses process, voltage and temperature variations, and their impact on circuits and microarchitecture. Possible solutions to reduce the impact of parameter variations on digital and analog circuits, and to achieve higher target frequencies are also presented.