Fault Diagnosis using Functional Fault Models for VHDL descriptions

V. Pitchumani, Pankaj Mayor, N. Radia
{"title":"Fault Diagnosis using Functional Fault Models for VHDL descriptions","authors":"V. Pitchumani, Pankaj Mayor, N. Radia","doi":"10.1109/TEST.1991.519525","DOIUrl":null,"url":null,"abstract":"This paper describes algorithms for fault diagnosis of computer hardware modeled in VHDL [1,2,3,4]. Given a VHDL description, the compiler creates an internal representation. For fault diagnosis, a hierarchical approach using the stuck-at fault model at the first level and the arbitrary failure model at the second level, is used. The diagnosis algorithm reasons from first principles using constraint suspension.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519525","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

This paper describes algorithms for fault diagnosis of computer hardware modeled in VHDL [1,2,3,4]. Given a VHDL description, the compiler creates an internal representation. For fault diagnosis, a hierarchical approach using the stuck-at fault model at the first level and the arbitrary failure model at the second level, is used. The diagnosis algorithm reasons from first principles using constraint suspension.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
用功能故障模型进行VHDL描述的故障诊断
本文描述了用VHDL[1,2,3,4]建模的计算机硬件故障诊断算法。给定一个VHDL描述,编译器创建一个内部表示。在故障诊断方面,采用了一种分层方法,第一层是卡滞故障模型,第二层是任意故障模型。该诊断算法从第一性原理出发,采用约束悬架进行推理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
REAL-TIME DATA COMPARISON FOR GIGAHERTZ DIGITAL TEST REFINED BOUNDS ON SIGNATURE ANALYSIS ALIASING FOR RANDOM TESTING IMPLEMENTING BOUNDARY-SCAN AND PSEUDO-RANDOM BIST IN AN ASYNCHRONOUS TRANSFER MODE SWITCH ADVANCED MIXED SIGNAL TESTING BY DSP LOCALIZED TESTER AN IEEE 1149.1 BASED LOGIC/SIGNATURE ANALYZER IN A CHIP
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1