CONCURRENT ERROR DETECTION FOR RESTRICTED FAULT SETS IN SEQUENTIAL CIRCUITS AND MICROPROGRAMMED CONT

Lawrence P. Holmquist, L. Kinney
{"title":"CONCURRENT ERROR DETECTION FOR RESTRICTED FAULT SETS IN SEQUENTIAL CIRCUITS AND MICROPROGRAMMED CONT","authors":"Lawrence P. Holmquist, L. Kinney","doi":"10.1109/TEST.1991.519758","DOIUrl":null,"url":null,"abstract":"A methodology is developed using convolutional codes for on-line detection of sequencing errors in sequential circuits induced by any given set of transient faults. Key outputs are added to the machine. In the casc of microprogrammed control units, key bits are appended to each microinstruction. The keys are chosen such that all sequences of key outputs are code sequences in a convolutional code. Using an error-detecting decoder for the code, all transient sequencing errors resulting from faults in the fault set can be detected with latency not exceeding the latency distance of the convolutional code.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"91 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519758","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

A methodology is developed using convolutional codes for on-line detection of sequencing errors in sequential circuits induced by any given set of transient faults. Key outputs are added to the machine. In the casc of microprogrammed control units, key bits are appended to each microinstruction. The keys are chosen such that all sequences of key outputs are code sequences in a convolutional code. Using an error-detecting decoder for the code, all transient sequencing errors resulting from faults in the fault set can be detected with latency not exceeding the latency distance of the convolutional code.
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顺序电路和微程序控制中限制故障集的并发错误检测
提出了一种利用卷积码在线检测时序电路中由任意一组瞬态故障引起的时序误差的方法。关键输出被添加到机器中。在微程序控制单元的情况下,每个微指令都附加了关键位。密钥的选择使得所有密钥输出序列都是卷积代码中的代码序列。使用错误检测解码器,可以检测到故障集中故障导致的所有瞬态测序错误,延迟时间不超过卷积码的延迟距离。
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