W. Si, H. Chung, M. Dudley, A. Anselmo, D. F. Bliss, V. Prasad
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引用次数: 1
Abstract
The application of synchrotron white beam X-ray topography (SWBXT) as a non-destructive diagnostic technique to the characterization of defect structures in large size InP single crystals was presented. Various kinds of defect configurations, including slip bands, micro-twin lamellae, growth striations, individual dislocations, and precipitates, were revealed. The relationship between defect formation and growth conditions was briefly discussed.
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