V. Chan, A. Gasasira, R. Pujari, R. Southwick, I. Ok, S. Choi, C. Silvestre, G. Burr, N. Saulnier, S. Teehan, I. Ahsan
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引用次数: 1
Abstract
We discuss inline electrical testing to monitor the baseline of Analog Computing hardware using Phase Change Memory (PCM) technology. Tightening the PCM resistance distribution is necessary to meet analog computation requirement. A new yield methodology is introduced.
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