Dynamic vs Static Burn-in for 16nm Production

Abstract

As the automotive industry moves toward autonomous driving and zero defect, production burn-in becomes more important, so is optimizing its efficiency. Although dynamic burn-in is considered more efficient than static in theory, there have been very few reported studies based on actual data. This work analyzes production burn-in data of ~34k units produced using TSMC’s 16nm process, and shows that dynamic burn-in is approximately >4x as effective as static burn-in in catching early silicon failures