{"title":"TWO-STAGE FAULT LOCATION","authors":"P. Ryan, S. Rawat, W. Fuchs","doi":"10.1109/TEST.1991.519762","DOIUrl":null,"url":null,"abstract":"A two-stage procedure for locating VLSI faults is presented. The approach utilizes dynamic fault dictionaries, test set partitioning, and reduced fault lists to achieve a reduction in size and complexity over classic static fault dictionaries. An industrial implementation is reported in which faults were injected and diagnosed in a VLSI chip and the perjiormunce of two-stage fault location was measured.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"80","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519762","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 80
Abstract
A two-stage procedure for locating VLSI faults is presented. The approach utilizes dynamic fault dictionaries, test set partitioning, and reduced fault lists to achieve a reduction in size and complexity over classic static fault dictionaries. An industrial implementation is reported in which faults were injected and diagnosed in a VLSI chip and the perjiormunce of two-stage fault location was measured.
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