{"title":"IDDq benefits (digital CMOS testing)","authors":"Steven D. McEuen","doi":"10.1109/VTEST.1991.208172","DOIUrl":null,"url":null,"abstract":"The author discusses many different aspects of IDDq, quality, reliability, and test being the major three. A description of IDDq is presented with different pragmatic methods of implementing it. Employing IDDq testing on digital CMOS technology, the user obtains a product with greater reliability. These benefits are introduced, which clearly support IDDq's implementation.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1991.208172","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 31
Abstract
The author discusses many different aspects of IDDq, quality, reliability, and test being the major three. A description of IDDq is presented with different pragmatic methods of implementing it. Employing IDDq testing on digital CMOS technology, the user obtains a product with greater reliability. These benefits are introduced, which clearly support IDDq's implementation.<>
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