T. Fukumori, T. Akahoshi, D. Mizutani, S. Sakuyama
{"title":"Correlation between Insertion Loss and Interface Relative Conductivity","authors":"T. Fukumori, T. Akahoshi, D. Mizutani, S. Sakuyama","doi":"10.23919/ICEP.2019.8733470","DOIUrl":null,"url":null,"abstract":"For high-speed signal transmission lines in printed wiring boards, a parameter is required to determine the insertion loss in the line. Surface relative conductivity (σr) is considered to be a promising option. However, surface σr cannot always be measured because of the surface treatment or semi-additive process used. In this report, we characterize the conditions of the interface conductor by the interface σr. The results show a strong correlation between insertion loss and interface or. Therefore, we consider interface or to be useful in characterizing the conductor interface conditions with respect to insertion losses.","PeriodicalId":213025,"journal":{"name":"2019 International Conference on Electronics Packaging (ICEP)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Electronics Packaging (ICEP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ICEP.2019.8733470","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
For high-speed signal transmission lines in printed wiring boards, a parameter is required to determine the insertion loss in the line. Surface relative conductivity (σr) is considered to be a promising option. However, surface σr cannot always be measured because of the surface treatment or semi-additive process used. In this report, we characterize the conditions of the interface conductor by the interface σr. The results show a strong correlation between insertion loss and interface or. Therefore, we consider interface or to be useful in characterizing the conductor interface conditions with respect to insertion losses.