Radiation-Hardened Memory Cell for Ultralow Power Space Applications

Abstract

In this paper, a novel radiation hardened memory cell for low-voltage operation and ultralow power space applications is proposed, and named as RHDMC. By special layout design, RHDMC can not only tolerate single event upset, but also can mitigate single event multiple upsets. Compared with recently published low power memory cell for low-voltage operation, simulation results (not on experimental data) show that, at the expense of a 129.5% area overhead, the proposed memory cell can provide much lower power consumption during SEU occurrence. To make comparisons, access time and power are also investigated between our proposed memory and LA13T.