{"title":"THE EFFECT OF DIFFERENT TEST SETS ON QUALITY LEVEL PREDICTION: WHEN IS 80% BETTER THAN 90%?","authors":"P. Maxwell, R. Aitken, V. Johansen, I. Chiang","doi":"10.1109/TEST.1991.519695","DOIUrl":null,"url":null,"abstract":"This paper discusses the use of stuck-at fault coverage as a means of determining quality levels. Data from a part tested with both functional and scan tests is analyzed and compared to three existing theories. It is shown that reasonable predictions of quality level are possible for the functional tests, but that scan tests produce significantly worse quality levels than predicted, Apparent clustering of defects resulted in very good quality levels for fault coverages less than 99%.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"193 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"182","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519695","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 182
Abstract
This paper discusses the use of stuck-at fault coverage as a means of determining quality levels. Data from a part tested with both functional and scan tests is analyzed and compared to three existing theories. It is shown that reasonable predictions of quality level are possible for the functional tests, but that scan tests produce significantly worse quality levels than predicted, Apparent clustering of defects resulted in very good quality levels for fault coverages less than 99%.
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