{"title":"Realistic Radiation and PVTA fault simulation for OFDM synchronization","authors":"K. Niederkleine, Theodor Hillebrand, S. Paul","doi":"10.1109/RADECS45761.2018.9328670","DOIUrl":null,"url":null,"abstract":"Semiconductor design for radiation environments usualy applies worst-case estimations to calculate the needs for reliable operation. The ability to simulate components for any mission is an advantage in this process and helps to save costs.","PeriodicalId":248855,"journal":{"name":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS45761.2018.9328670","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Semiconductor design for radiation environments usualy applies worst-case estimations to calculate the needs for reliable operation. The ability to simulate components for any mission is an advantage in this process and helps to save costs.
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