M. O’Bryan, K. Label, J. Pellish, Dakai Chen, J. Lauenstein, C. Marshall, R. Ladbury, T. Oldham, Hak S. Kim, A. Phan, M. Berg, M. Carts, A. Sanders, S. Buchner, P. Marshall, M. Xapsos, F. Irom, L. Pearce, E. T. Thomson, T. Bernard, H. W. Satterfield, A. P. Williams, N. V. van Vonno, J. Salzman, Sam Burns, Rafi Albarian
{"title":"Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA","authors":"M. O’Bryan, K. Label, J. Pellish, Dakai Chen, J. Lauenstein, C. Marshall, R. Ladbury, T. Oldham, Hak S. Kim, A. Phan, M. Berg, M. Carts, A. Sanders, S. Buchner, P. Marshall, M. Xapsos, F. Irom, L. Pearce, E. T. Thomson, T. Bernard, H. W. Satterfield, A. P. Williams, N. V. van Vonno, J. Salzman, Sam Burns, Rafi Albarian","doi":"10.1109/REDW.2010.5619494","DOIUrl":null,"url":null,"abstract":"We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.","PeriodicalId":278033,"journal":{"name":"2010 IEEE Radiation Effects Data Workshop","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Radiation Effects Data Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2010.5619494","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
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