M. Gorbunov, A. A. Antonov, P. A. Monakhov, V. Anashin, Andrey A. Klyayn, A. Koziukov, E. Imametdinov, Elena V. Marina
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引用次数: 1
Abstract
We present the direct experimental vulnerability comparison of two microprocessor designs with different Single Event Effects (SEE) mitigation techniques at different heavy ion fluxes. The trade-off between the performance, fault-tolerance and power consumption is considered. We introduce the Mean Fluence Between Failures (MFBF) metric for the vulnerability comparison.