H. Torres, J. Cruz-Colon, V. Narayanan, J. Valle, R. Baumann
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引用次数: 0
Abstract
Single Events Effect (SEE) and Total Ionizing Dose (TID) characterization results for the new TPS50601A-SP, 6 A, DC-DC converter from Texas Instruments are presented. The TPS50601A-SP is Radiation Hardness Assured (RHA) up to a TID=100 krad (Si) for HDR and LDR and SEL-SEB-SEGR free up to LETEFF=75 MeV-cm2/mg. SET's were characterized up to LETEFF=65 MeV-cm2/mg.
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