{"title":"Localization of the near-field enhancement by 3D ring-zone structure","authors":"P. Micek, P. Gašo, D. Pudiš","doi":"10.1109/ASDAM55965.2022.9966787","DOIUrl":null,"url":null,"abstract":"This work deals with a simulation-based design and near-field optical microscopy measurement of IP-Dip photoresist near-field probe consisting of a series of elevated ring zone plates. The height increment implemented into the ring zone plates effectively suppresses the diffraction phenomena resulting in a narrow emission of the evanescent and propagating modes along the optical axis.","PeriodicalId":148302,"journal":{"name":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASDAM55965.2022.9966787","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This work deals with a simulation-based design and near-field optical microscopy measurement of IP-Dip photoresist near-field probe consisting of a series of elevated ring zone plates. The height increment implemented into the ring zone plates effectively suppresses the diffraction phenomena resulting in a narrow emission of the evanescent and propagating modes along the optical axis.