Radu Dumitru, C. Hafer, Tzu-Wen Wu, R. Rominger, H. Gardner, P. Milliken, Kevin Bruno, T. Farris
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引用次数: 4
Abstract
Radiation hardness characterization has been performed on a RadHard-by-Design ASIC Library designed using a 130nm commercial fab process. Test chip results are presented illustrating the ASIC library performance and radiation hardness response.
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