Uncertainty Quantification of Memristor Crossbar Array for Vector Matrix Multiplication

Rohan Kumar, Aksh Chordia, AR Aswani, A. James, J. N. Tripathi
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引用次数: 4

Abstract

This work focuses on the study of variability analysis of a memristor-based crossbar. The memristor crossbars are particularly useful in neuromorphic circuits due to their high power efficiency and low latency. This paper presents a variability analysis of the Roff to Ron ratio due to the change in the parameters of the crossbar cell. A single cell in the crossbar consists of one transistor one memristor (1T1M) based structure. The Zewail-city memristor model is used in the crossbar cell for the analysis. This paper also presents the analysis of the 1T1M structure and 1T1M based crossbar read-write operations. For variability analysis, a stochastic technique named Polynomial Chaos is used and the results are compared with the standard Monte Carlo simulations.
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矢量矩阵乘法中忆阻器横栅阵列的不确定度量化
本文主要研究了基于忆阻器的交叉杆的变异性分析。忆阻交叉栅由于其高功率效率和低延迟而在神经形态电路中特别有用。本文给出了由于交叉栅电池参数变化而引起的Roff / Ron比的变异性分析。横杆中的单个单元由一个晶体管和一个忆阻器(1T1M)结构组成。横杆单元采用Zewail-city记忆电阻器模型进行分析。本文还分析了1T1M的结构和基于1T1M的交叉条读写操作。对于变异性分析,采用了一种称为多项式混沌的随机技术,并将结果与标准蒙特卡罗模拟进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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