Does the floorplan of a chip affect its yield?

Z. Koren, I. Koren
{"title":"Does the floorplan of a chip affect its yield?","authors":"Z. Koren, I. Koren","doi":"10.1109/DFTVS.1993.595754","DOIUrl":null,"url":null,"abstract":"The floorplan of a VLSI chip and its projected yield are usually considered to be completely unrelated issues. This commonly used assumption does not necessarily hold for several recently designed VLSI chips that incorporate some defect tolerance. The purpose of this work is to investigate the relationship between floorplanning and yield for this type of chip.","PeriodicalId":213798,"journal":{"name":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"84 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1993.595754","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

The floorplan of a VLSI chip and its projected yield are usually considered to be completely unrelated issues. This commonly used assumption does not necessarily hold for several recently designed VLSI chips that incorporate some defect tolerance. The purpose of this work is to investigate the relationship between floorplanning and yield for this type of chip.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
芯片的平面布局会影响其成品率吗?
超大规模集成电路芯片的平面布局和预期良率通常被认为是完全不相关的问题。这种常用的假设并不一定适用于一些最近设计的集成了一些缺陷容限的VLSI芯片。这项工作的目的是研究平面规划和成品率之间的关系,为这类芯片。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
The T9 transputer: A practical example of the application of standard test techniques Fault detection in sequential circuits through functional testing A highly testable 1-out-of-3 CMOS checker System level policies for fault tolerance issues in the FERMI project Topological optimization of PLAs for yield enhancement
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1