{"title":"A WORKSTATION ENVIRONMENT FOR BOUNDARY SCAN INTERCONNECT TESTING","authors":"T. Moore","doi":"10.1109/TEST.1991.519779","DOIUrl":null,"url":null,"abstract":"The testing of logic devices incorporating boundary scan with the IEEE 1149.1 standard has been shown to be a practical method to test and diagnose loaded board interconnect. A highly flexible workstation based boundary scan interconnect tesr system has been used to provide low cost interconnect verification. This paper will describe the suite of tools, their integration, and their application to diFerent test requirements.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519779","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The testing of logic devices incorporating boundary scan with the IEEE 1149.1 standard has been shown to be a practical method to test and diagnose loaded board interconnect. A highly flexible workstation based boundary scan interconnect tesr system has been used to provide low cost interconnect verification. This paper will describe the suite of tools, their integration, and their application to diFerent test requirements.