{"title":"Radiation Test of 8 Bit Microcontrollers ATmega128 & AT90CAN128","authors":"A. Schuttauf, S. Rakers, C. Daniel","doi":"10.1109/REDW.2010.5619504","DOIUrl":null,"url":null,"abstract":"We have performed heavy ion tests of the ATmega128 and AT90CAN128 micro controller. These COTS devices have shown a quite different sensitivity to SEL/SEU errors, where the current consumption showed a step like behaviour. Detailed measurements, analyses and on-orbit rates are presented.","PeriodicalId":278033,"journal":{"name":"2010 IEEE Radiation Effects Data Workshop","volume":"252 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Radiation Effects Data Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2010.5619504","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
We have performed heavy ion tests of the ATmega128 and AT90CAN128 micro controller. These COTS devices have shown a quite different sensitivity to SEL/SEU errors, where the current consumption showed a step like behaviour. Detailed measurements, analyses and on-orbit rates are presented.
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