Subrat Mishra, P. Weckx, Ji-Yung Lin, B. Kaczer, D. Linten, A. Spessot, F. Catthoor
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引用次数: 1
Abstract
A common approach to incorporate workload dependent aging in circuits is to use an effective stress time or so-called signal probability (SP) to calculate degradation under realistic workload scenarios. However, this approach is not fully physics-based and incurs erroneous estimation of degradation. Moreover, cycle-accurate (CA) simulations are computationally expensive. In this paper, a relatively fast yet accurate, adaptive waveform splitting (AWS) algorithm is proposed to enable fast calculation of workload-dependent device aging. The proposed algorithm has been adopted to perform aging estimation of large circuits under specific workload scenarios.
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