A 60pJ, 3-Clock Rising Time, VTH Loss Compensated Word-Line Booster Circuit for 0.5V Power Supply Embedded/Discrete DRAMs

S. Tanakamaru, K. Takeuchi
{"title":"A 60pJ, 3-Clock Rising Time, VTH Loss Compensated Word-Line Booster Circuit for 0.5V Power Supply Embedded/Discrete DRAMs","authors":"S. Tanakamaru, K. Takeuchi","doi":"10.1109/IMW.2009.5090572","DOIUrl":null,"url":null,"abstract":"A low power high-speed word-line booster is proposed for 0.5 V operation embedded and discrete DRAMs. Compared with the conventional boosters, the rising time and the power consumption are 25% and 48%, respectively, with the same circuit area.","PeriodicalId":113507,"journal":{"name":"2009 IEEE International Memory Workshop","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE International Memory Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2009.5090572","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

A low power high-speed word-line booster is proposed for 0.5 V operation embedded and discrete DRAMs. Compared with the conventional boosters, the rising time and the power consumption are 25% and 48%, respectively, with the same circuit area.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
一种60pJ, 3时钟上升时间,VTH损耗补偿字线升压电路,用于0.5V电源嵌入式/分立dram
提出了一种适用于0.5 V工作的嵌入式和离散型dram的低功耗高速字线升压电路。在电路面积相同的情况下,与传统升压器相比,升压时间和功耗分别提高了25%和48%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Chip Level Reliability of MANOS Cells under Operating Conditions Low Temperature Rectifying Junctions for Crossbar Non-Volatile Memory Devices 16Mb Split Gate Flash Memory with Improved Process Window Thin Layers Obtained by Plasma Process for Emerging Non-Volatile Memory (RRAM) Applications Both NOR and NAND Embedded Hybrid Flash for S-SIM Application Using 90 nm Process Technology
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1