{"title":"A new approach for predicting AC hot carrier lifetime","authors":"H. Kato","doi":"10.1109/IRWS.1995.493586","DOIUrl":null,"url":null,"abstract":"The author focuses on how to predict AC hot carrier (MC) lifetime based on the DC HC stress data. As an introduction, he explains the AC transition waveform of an inverter. Then, conventional techniques to predict AC HC lifetime are described. The new technique is then detailed, including the acceleration model, the device parameter to be monitored, and the AC/DC ratio.","PeriodicalId":355898,"journal":{"name":"IEEE 1995 International Integrated Reliability Workshop. Final Report","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1995 International Integrated Reliability Workshop. Final Report","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRWS.1995.493586","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The author focuses on how to predict AC hot carrier (MC) lifetime based on the DC HC stress data. As an introduction, he explains the AC transition waveform of an inverter. Then, conventional techniques to predict AC HC lifetime are described. The new technique is then detailed, including the acceleration model, the device parameter to be monitored, and the AC/DC ratio.
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